| Institution: |
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| Acronym: | AMiR |
| Department: | Dept. of Computing Science, Division Microrobotics and Control Engineering (AMiR) |
| Group: | Robotic Manipulation, Characterization and Processing on the Nanoscale |
| Type of Institution: | University |
| Contact Person: | Soeren Zimmermann (More info) |
| Address: | Ammerlaender Heerstraße 114-118, D-26129 Oldenburg |
| Country: | Germany |
| Phone: | +494417984331 |
| Fax: | +494417984267 |
| Website: | http://www.amir.uni-oldenburg.de/en/409.html |
| Main research areas: |
Growth, synthesis techniques and integration methods Nanoelectromechanical systems Spectroscopies and Microscopies Nanorobotics |
| Personal: |
| Permanent Staff: 5 |
Post doctoral: 2 |
PhD: 12 |
| Technicians: 1 |
Others: 0 |
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| Participating Projects (Graphene related) |
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P1: NanoBits - Exchangeable and Customizable Scanning Probe Tips - More Info Coordinator: Dr. Albert Sill (OFFIS, Germany) Funding Source: European Union Total Funding: 2500000 € - Partner Funding: 870000€ - Nº of Partners: 6 Starting Year: 2010 - Duration: 3 years. |
| Funding (average per year) |
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2010: 290000 € (P1:NanoBits) | |
2011: 290000 € (P1:NanoBits) | |
2012: 290000 € (P1:NanoBits) | |
| Infrastructures |
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Tool: Dual Beam HRSEM/FIB with gas injection system; Trade Name: TESCAN; Model: LYRA; Installation Year: 2009; Tool Specificities: |
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Tool: AFM; Trade Name: JPK; Model: NanoWizard II; Installation Year: 2008; Tool Specificities: |
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Infrastructure: Nanorobotic Characterisation Lab; Area: 50; Installation Year: 2001; Main tools available: 3 SEMs, 2 AFMs, 2 Optical inverted microscopes, semiconductor device analyser Agilent B1500A, Network Analyser Agilent E5061A,... |
| Graphene research topics |
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| · THEORETICAL AND EXPERIMENTAL RESEARCH ACTIVITIES |
| Growth, synthesis techniques and integration methods |
| Exfoliation |
| Others |
| Spectroscopies and Microscopies |
| Optics |
| STM |
| AFM |
| Nanoelectromechanical systems |
| Molecular, chemical and bio sensing |
| Nanoelectronics devices |
| sensors |